BrighTex Bio-Photonics Technologies leads the way in advanced semiconductor and industrial metrology, combining optical engineering and AI to deliver unmatched accuracy in inspection and measurement.
Our platform brings together automated AI model training, intuitive data labeling, and advanced comparison tools in one streamlined solution. With minimal input, you can train models, manage datasets, and compare two samples—such as semiconductor wafers—to detect even the smallest deviations from a golden reference. Built for efficiency and accuracy, this solution simplifies complex workflows without sacrificing control. From data preparation to quality analysis, it accelerates your AI projects and ensures consistent, reliable outcomes.
Data Preparation
Use annotated images of good and/or defective substrate to train the AI model. As an example see our WELDinspect system.
Model Training
Automated routines train models to identify specific defects such as Edge defects, Cracks, Scratches, FM(foreign material), Stains, Surface Pitting, porosity, undercut, incomplete fusion or overlap.
Real-Time Detection
As golden or defect images are captured, the AI module can assess images simultaneously to speed up detection and classification of defects without any overhead for processing.
Custom Defect Categories
Tailor your AI to meet your unique compliance standards.
Continuous Improvement
As more images are captured and processed over time, the AI model continuously improves the higher probability of the capture rate.
MACRO INSPEC
Clarity Macro Full Wafer / Glass Surface Inspection 2D/3D
First system in the world to do Glass & wafer 3D & 2D analysis simultaneously. Increase your yield with the most advanced A.I. in semiconductor metrology. system detects and quantifies process defects. Glass & Wafer metrology is the key to process control and yield enhancement.
View Glass Defect Inspection System View Sherlock System
MICRO INSPEC
Clarity Micro Review Station 2D/3D
Our software can be added to any dark field microscope. With our analysis tools, you can create detailed 3D or 2D maps(depending on lighting). When combined with our virtual measurement tools you can find the sizes and volume of things you never thought possible.
View 2D 3D Profiler System View WELDinspect System
IR INSPEC
Clarity Bonded Wafer Void Inspection and Internal Stress Micro to Macro
The IRQuickScanTM (IRQS) System utilizes a newly-developed, proprietary infrared detection scheme coupled with the powerful ClarityTM software platform to quickly characterize a variety of substrates for internal defects.
View IRQS System
Brightex Bio-Photonics Cosmetic Solutions
Powering human analytics through deep learning.